Topic: GOES-19 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: March 16, 2026 1208Z

Product(s) or Data Impacted: GOES-19 SEISS MPS-LO

Date/Time of Initial Impact: March 18, 2026 1530z DOY 075

Date/Time of Expected End: March 19, 2026 1730z DOY 076

Length of Outage: 26 hours of product degradation

Details/Specifics of Change: A GOES-19 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2026/075 1530z to 2026/076 1730z. The calibration will consist of 2 hours of commanding followed by a 24 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations: ESPCOperations@noaa.gov or 301-817-3880; GOES Payload Engineering: 301-817-4409

Web Site(s) for applicable information: N/A

This message was sent by ESPC.Notification@noaa.gov. You have been sent this and other notifications because you have opted in to receive it. If for any reason, you wish to unsubscribe, please contact ESPC Help Desk at ESPCOperations@noaa.govor (301) 817-3880. Please note: it may take up to two business days to process your unsubscribe request.