Topic: GOES-19 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: March 10, 2026 1516Z

Product(s) or Data Impacted: GOES-19 SEISS MPS-LO

Date/Time of Initial Impact: March 16, 2026 1530z DOY 075

Date/Time of Expected End: March 17, 2026 1730z DOY 076

Length of Outage: 26.5 hours of product degradation

Details/Specifics:

A GOES-19 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2026/075 1530z to 2026/076 1730z. The calibration will consist of 2 hours of commanding followed by a 24 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations: ESPCOperations@noaa.gov or 301-817-3880; GOES Payload Engineering: 301-817-4409

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