Update #2: The GOES-16 SEISS MPS-Lo HV Optimization has been rescheduled for June 26, 2023 1630z

Update #1: The GOES-16 SEISS MPS-Lo HV Optimization has been postponed due to high local space weather environment. Rescheduled date TBD.

Topic: GOES-16 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: June 20, 2023 2303Z

Product(s) or Data Impacted: GOES-16 SEISS MPS-LO

Date/Time of Initial Impact: June 26, 2023 1630z

Date/Time of Expected End: June 27, 2023 1930z

Length of Outage: 27 hours of product degradation

Details/Specifics of Change:

A GOES-16 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2023/177 1630z to 2023/178 1930z. The calibration will consist of 2 hours of commanding followed by a 25 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 27 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be canceled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations: ESPCOperations@noaa.gov or 301-817-3880; GOES Payload Engineering: 301-817-4409

Web Site(s) for applicable information: N/A

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