Topic: GOES-17 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: November 30, 2022 1455z

Product(s) or Data Impacted: GOES-17 SEISS MPS-LO

Date/Time of Initial Impact: December 7, 2022 1500Z

Date/Time of Expected End: December 8, 2022 1800Z

Length of Outage: 27 hours of product degradation

Details/Specifics of Change: A GOES-17 (GOES-EAST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from 2022/341T 1500z to 2022/342T 1800z. The calibration will consist of 3 hours of commanding followed by a 24 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 27 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880 GOES Payload Engineering: 301-817-4409

Web Site(s) for applicable information: N/A

This message was sent by ESPC.Notification@noaa.gov. You have been sent this and other notifications because you have opted in to receive it. If for any reason, you wish to unsubscribe, please contact ESPC Help Desk at ESPCOperations@noaa.gov or (301) 817-3880. Please note: it may take up to two business days to process your unsubscribe request