Topic: GOES-17 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration (impacts SEISS)

Date/Time Issued: March 12, 2020 1645 UTC

Product(s) or Data Impacted: GOES-17 SEISS MPS-LO

Date/Time of Initial Impact: March 16, 2020 1430 UTC

Date/Time of Expected End: March 17, 2020 1630 UTC

Length of Outage: 26 hours of product degradation

Details/Specifics of Change: A GOES-17 (GOES-WEST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed from March 16, 2020 14:30 UTC to March 17, 2020 16:30UTC. The calibration will consist of 2 hours of commanding followed by a 24 hour power off of the MPS-LO Deflection Electrode High Voltage (required for performance data collection). SEISS MPS-LO will experience data degradation during this 26 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

This planned SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880

GOES Payload Engineering at 301-817-4409

Web Site(s) for applicable information: N/A

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