Topic: GOES-17 SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration

Date/Time Issued: September 17, 2019 1143Z

Product(s) or Data Impacted: GOES-17 SEISS MPS-LO

Date/Time of Initial Impact: September 17, 2019 1600Z

Date/Time of Expected End: September 18, 2019 1800Z

Length of Outage: 26 hours of product degradation

Details and Specifics of Change: A GOES-17 (GOES-WEST) SEISS MPS-LO Electron and Ion Microchannel Plate (MCP) HV Bias Calibration will be performed on Tuesday September 17, 2019, from 1600-1800Z resulting in a SEISS MPS-LO data degradation for 2 hours. Upon conclusion of calibration activities, MPS-LO Deflection Electrode High Voltage will be powered off for 24 hours to collect performance data before being powered on the following day. SEISS MPS-LO will experience data degradation during this 26 hour period until the Deflection Electrode High Voltage is powered back on returning the sensor to nominal operation.

The SEISS MPS-LO Calibration will be cancelled due to CWD or if the Space Weather environment is not appropriate for the calibration.

Contact Information for Further Information: ESPC Operations at ESPCOperations@noaa.gov or 301-817-3880

Web Site(s) for applicable information: N/A

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